The R&S®FSL-K30 application firmware provides the R&S®FSL spectrum analyzer with features otherwise only provided by special noise measurement analyzers.
The following parameters can be measured at a specified
frequency or in a selectable frequency range:
-
Noise figure in dB
-
Noise temperature in K
-
Gain in dB
Compared with conventional noise measurement systems, R&S®FSL-K30 has the advantage that a wide variety of further RF measurements can also be performed.
The R&S®FSL-K30 is also available for the R&S®ZVL3 and R&S®ZVL6 Vector Network Analyzers (with the R&S®ZVL-K1 spectrum analysis option and the R&S®FSL-B5 additional interfaces option).
